The Bruker Dimension Edge AFM provides nanoscale measurements of surface topography such as roughness and step height as well as nanomechanical properties. This system can be used with a variety of probes, depending on the application. Its motorized stage allows the investigation of large sample and the enclosure provides thermal and vibration insulation for high-resolution
measurements.
Operational Modes and Capabilities
- PeakForce Tapping with ScanAsyst: Bruker proprietary mode for obtaining topographic information and force measurements. Utilizes lower force than standard tapping which results in higher resolution and longer tip life for both air and fluid imaging. ScanAsyst provides automated image parameter adjustment and will adapt to changes in topography.
- Contact & tapping: Standard imaging modes for topographic information and force measurements
- Single point spectroscopy: Used to obtain force curves for quantitative measure of mechanical properties such as adhesion and stiffness (modulus).
- Force modulation: Specialized mode to obtain a map of qualitative nanomechanical properties in composite samples, such as polymer blends and metal alloys.
- Fluid imaging for biological samples
- Nanolithography
Specifications
- 90 μm x 90 μm scan range
- 10 μm maximum feature height
- Vertical noise floor (Z resolution) = <50pm RMS
- Sample size up to 150 mm in diameter and 15 mm thick